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Straightforward prediction of the Ni1−x O layers stoichiometry by using optical and electrochemical measurements
Laura Maria Manceriu, Pierre Colson, Anthony Maho, Gauthier Eppe, Ngoc Duy Nguyen, Christine Labrugere, Aline Rougier, Rudi Cloots, Catherine Henrist

Published: 15 May 2017 by IOP Publishing in Journal of Physics D: Applied Physics
IOP Publishing, Volume 50; 10.1088/1361-6463/aa6e71
Keywords: Ni1, nickel, thermal treatment, ultrasonic, spray pyrolysis, Ni3, films, Circuit Potential
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