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Frost damage detection in sugarcane crop using MODIS images and SRTM data
Bernardo Friedrich Theodor Rudorff, 1 Daniel Alves Aguiar, Marcos Adami, Moisés Pereira Galvão Salgado
1  Remote Sensing Div. (DSR), Nat. Inst. for Space Res. (INPE), Sao Jose dos Campos, Brazil

Published: 01 July 2012 by Institute of Electrical and Electronics Engineers (IEEE) in 2012 IEEE International Geoscience and Remote Sensing Symposium
Institute of Electrical and Electronics Engineers (IEEE), 10.1109/igarss.2012.6352315
Keywords: MODIS time-series, Sugarcane Yield
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