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Terahertz transmission properties of silicon wafers using continuous-wave terahertz spectroscopy
Chihoon Kim, Jae Sung Ahn, Taeksoo Ji, Joo Beom Eom

Published: 06 February 2017 by IOP Publishing in Measurement Science and Technology
IOP Publishing, Volume 28; 10.1088/1361-6501/aa57e5
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