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Sanitization of Data in Nanoscale Flash Memory by Thermal Erasing and Reuse of Storage
Jun-Young Park, 1 Dong-Il Moon, 2 Seong-Yeon Kim, 1 Hwon Im, 1 Ki Soo Chang, 3 Chanbae Jeong, 3 Yang-Kyu Choi 1
1  School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST); 291 Daehak-ro Daejeon 34141 Republic of Korea
2  Center for Nanotechnology, NASA Ames Research Center; Moffett Field CA 94035 USA
3  Division of Scientific Instrumentation, Korea Basic Science Institute (KBSI); 169-148 Gwahangno Daejeon 34133 Republic of Korea

Published: 30 April 2018 by Wiley in physica status solidi (a)
Wiley, Volume 215; 10.1002/pssa.201800194
Keywords: heat treatment, Data Security, nanowires, flash memory, Thermal Erasing, field‐effect transistor
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