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C. Zappacosta  - - - 
Top co-authors
Guillermo Robles

66 shared publications

Department of Electrical Engineering, Universidad Carlos III de Madrid, Leganés, Spain

B. Tellini

36 shared publications

Department of Energy, Systems, Land and Constructions Engineering, University of Pisa, Pisa, Italy

Javier Sanz

3 shared publications

Departamento de Ingeniería Eléctrica, Universidad Carlos III de Madrid, 28911 Leganés, Madrid, Spain

5
Publications
0
Reads
0
Downloads
6
Citations
Publication Record
Distribution of Articles published per year 
(2008 - 2011)
Total number of journals
published in
 
3
 
Publications
Article 0 Reads 4 Citations Critical Parameters for Mutual Inductance Between Rogowski Coil and Primary Conductor M Marracci, B Tellini, C Zappacosta, Guillermo Robles Published: 01 February 2011
IEEE Transactions on Instrumentation and Measurement, doi: 10.1109/TIM.2010.2051591
DOI See at publisher website
Article 0 Reads 2 Citations Effective Magnetic Permeability Measurement in Composite Resonator Structures M. Bologna, A. Petri, B. Tellini, C. Zappacosta Published: 01 May 2010
IEEE Transactions on Instrumentation and Measurement, doi: 10.1109/TIM.2010.2044075
DOI See at publisher website
PROCEEDINGS-ARTICLE 0 Reads 0 Citations Critical parameters for mutual inductance between Rogowski coil and primary conductor G. Becherini, S. Di Fraia, M. Marracci, B. Tellini, C. Zappa... Published: 01 May 2009
2009 IEEE Intrumentation and Measurement Technology Conference, doi: 10.1109/imtc.2009.5168487
DOI See at publisher website
Article 0 Reads 0 Citations Shielding Effectiveness Measurements for Ferromagnetic Shields S. Di Fraia, M. Marracci, B. Tellini, C. Zappacosta Published: 01 January 2009
IEEE Transactions on Instrumentation and Measurement, doi: 10.1109/TIM.2008.928406
DOI See at publisher website
PROCEEDINGS-ARTICLE 0 Reads 0 Citations Designing and tuning an air-cored current transformer for partial discharges pulses measurements Guillermo Robles, J. M. Martinez, J. Sanz, B. Tellini, C. Za... Published: 01 May 2008
2008 IEEE Instrumentation and Measurement Technology Conference, doi: 10.1109/imtc.2008.4547380
DOI See at publisher website
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