Nanomaterials Webinar | X-ray Techniques for Nanomaterials Research
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25th Nanomaterials Webinar
X-ray Techniques for Nanomaterials Research
Advanced nanomaterials are increasingly enablers for high-tech products. The improved understanding of structure-property relationships of these materials is essential for their applications in many branches. Materials characterization provides the needed information about atomic structure, chemical binding, and the 3D microstructure of advanced materials. Within this context, high-resolution X-ray techniques are playing an important role in the development and introduction of new technologies as well as in the integration of advanced materials into high-tech products. One unique advantage of X-ray techniques is that they deliver generally integral data for bulk materials and thin films non-destructively.
The potential of X-ray techniques for materials characterization, as well as for the generation of data that describe structure, composition, and chemical binding, as well as 3D morphology and microstructure of materials, will be explained. New results from fundamental research will be showcased, along with application-specific solutions in metallurgy, renewable energy, biomimetics, and microelectronics. In-situ and operando studies of kinetic processes, such as micro-crack propagation, material fracture, and electrochemical reactions for energy storage and conversion, will be demonstrated.
Date: 15 January 2026
Time: 3:00 pm CET | 10:00 pm CST Asia
Webinar ID: 883 1386 6104
Webinar Secretariat: journal.webinar@mdpi.com
Meet Our Speakers
Prof. Dr. Ehrenfried Zschech
Research Area Nanomaterials, Brandenburg University of Technology Cottbus-Senftenberg, Germany;
Ehrenfried Zschech is a consultant with hands-on experience in the fields of advanced materials, nanotechnology, and microelectronics, as well as process control and quality assessment. He holds honorary professorships in Nanomaterials at Brandenburg University of Technology Cottbus-Senftenberg, Germany, and in Nanoanalysis at Dresden University of Technology, Germany. Additionally, he serves as a Guest Chair Professor at Southeast University, Nanjing, China. His activities include high-resolution X-ray imaging and the development of customized solutions for a wide range of applications, including package failure analysis, metrology, and inspection in the semiconductor industry. Ehrenfried Zschech received his Dr. rer. nat. degree from Dresden University of Technology, Germany. He held several management positions at Airbus, Advanced Micro Devices, Fraunhofer, and the start-up deepXscan. Ehrenfried Zschech is a Member of the European Academy of Science (EurASc) and a Member of the German National Academy of Science and Engineering (ACATECH). In 2019, he was awarded the FEMS European Materials Gold Medal, in 2023 the DGM Pioneer Award, and with the Roland Mitsche Prize.
Dr. Kristina Kutukova
PVA Technology Hub, Wettenberg, Germany;
Kristina Kutukova received her PhD from the Brandenburg University of Technology Cottbus-Senftenberg, Germany, in 2023. Her doctoral work, focusing on an "In-situ study of crack propagation in patterned structures of microchips using X-ray microscopy" earned her the DGM Young Scientist Award in 2023. Kristina Kutukova was a research associate in the Department of Microelectronic Materials and Nano-scale Analysis at Fraunhofer Institute for Ceramic Technologies and Systems Dresden, for more than 5 years. For several years, she was acting as Head of the Development and Application Lab at deepXscan GmbH, a start-up company, with the main tasks to the develop customized solutions for high-resolution 3D imaging and to coordinate development projects. Since September 2024 she took a role as Head of the Application X-ray in the PVA TePla Technology Hub in Dresden, dedicated to developing next generation of high-resolution X-ray microscopes for various areas of material metrology and defects inspection.
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