EventsThe 3rd International Electronic Conference on Processes
Published
This submission belongs to the session E. Process Control and Monitoring of the event The 3rd International Electronic Conference on Processes
Published date
28 May, 2024
Academic Editor
author-avatarWen-Jer Chang
Citation
Neelamadhab Padhy, Deepak Behera, Sandeep Kumar Behura, Shakina Bano, <span>Leveraging Machine Learning for Process Monitoring in Environmental Impact Tracking</span>, in Proceedings of The 3rd International Electronic Conference on Processes, 29 May–31 May 2024, MDPI: Basel, Switzerland
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Leveraging Machine Learning for Process Monitoring in Environmental Impact Tracking

1. Department of Computer science and engineering, school of engineering and technology, GIET University, Gunupur, Odisha, India
Abstract
Keywords
Data collection
Environment tracker
Machine learning algorithms