Fatigue Design of Mechanical Systems such as Refrigerator based on a quantum-transported life-stress model and sample size formulation

To increase the life of mechanical product such as refrigerator and automobile, new structured reliability method – parametric Accelerated Life Testing (ALT) was provided with reliability quantitative (RQ) statements. It included: (1) ALT scheme established on system BX lifetime that will be X percent of the accumulated failure, (2) load examination, (3) tailored parametric ALTs with the design modification, and (4) judgement if product design(s) achieves the targeted BX life. A quantum/transported life-stress model and sample size formulation were proposed. This new parametric ALT enables engineer to identify the design defects and modify them in the product development. As the problematic designs are recognized and altered by utilizing this parametric ALT, companies can get away from recalls due to the product failures in the marketplace. As case studies, two products were suggested: 1) troublesome refrigerator compressor failed from the field and 2) the action of redesigning the hinge kit system (HKS) in a household refrigerator. After several parametric ALTs with modifications, the mechanical products – compressor and HKS were expected to reach the lifetime – B1 life of ten year.