EventsThe 1st International Online Conference on Optics
Published
This submission belongs to the session S6. Quantum Optics of the event The 1st International Online Conference on Optics
Published date
20 Mar, 2026
Academic Editor
author-avatarAndrea Salamon
Citation
Riccardo Ciciotti, Filippo Pierucci, Mattia Scagliotti, Matteo Rapisarda, Fabio De Matteis, Paola Castrucci, Matteo Salvato, Development of Te/Bi₂Se₃ heterostructures for photodetectors sensitive to VIS and NIR wavelengths, in Proceedings of The 1st International Online Conference on Optics, 25 March–27 March 2026, MDPI: Basel, Switzerland
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Development of Te/Bi2Se3 heterostructures for photodetectors sensitive to VIS and NIR wavelengths

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Filippo Pierucci 1,2
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1. Department of Physics, University of Rome "Tor Vergata", Rome, 00133, Italy, Italy
2. Section of Rome "Tor Vergata", INFN, Rome, 00133, Italy
3. CNR, Institute for Microelectronics and Microsystems (IMM), Rome, 00133, Italy, Italy
4. Department of Industrial Engineering, University of Rome "Tor Vergata", Rome, 00133, Italy, Italy
Abstract

In recent years, two-dimensional materials (2DMs) have attracted considerable interest for their remarkable properties, which allow for them to be employed in many fields. In particular, 2DMs are increasingly finding application in the field of optoelectronics, with the aim of reducing manufacturing costs and device dimensions to enhance their efficiency. Furthermore, the van der Waals lattice structure of 2DMs enables them to be easily integrated with silicon technology. Unfortunately, the thin nature of these materials might result in weak light absorption. To address this issue, heterostructures of 2DMs are fabricated: combining them allows the tuning of electronic bandgaps, obtaining low-cost devices in a given range of wavelengths. Topological insulators (TIs) are 2DMs characterized by an insulating bulk gap and Dirac helical electronic surface states. Among these, Bi2Se3 demonstrates considerable potential in high-speed detection, due to the high mobility of surface electronic states and its 0.3 eV bandgap, which enable it to operate at telecommunications wavelengths=1550 nm). On the other hand, Te is a material with a thickness-dependent bandgap which extends from 0.3 eV (bulk) to 1.2 eV (monolayer). The absorbance of Te films in the infrared range is higher than Bi2Se3 of the same thickness. Considering these properties, we fabricated, through a low-cost vapor–solid deposition technique, a photodetector based on a Te/Bi2Se3 heterostructure, deposited onto a prepatterned n-Si substrate, in order to increase performance in both the VIS and IR spectral range. Single layers of Te and Bi2Se3 and Te/Bi2Se3 heterostructures were separately characterized by XRD and SEM to investigate their structural and morphological properties. The obtained Te/Bi2Se3 photodetectors are sensitive to both VIS (λ=633 nm) and IR (λ=1550 nm) light, exhibiting a responsivity of 2.6 A/W and a detectivity of 2.6 x 1011 Jones at λ=633 nm, and showing a linear and ultrafast response (108 ns).

Keywords
Optoelectronics
heterostructure
photodetector
telecommunications
vapor-solid deposition
Te
Bi2Se3
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