EventsThe 3rd International Electronic Conference on Machines and Applications
Published
This submission belongs to the session S1. Automation and Control Systems of the event The 3rd International Electronic Conference on Machines and Applications
Published date
07 May, 2026
Academic Editor
author-avatarJames Lam
Citation
THIAGO DOS SANTOS ALVES, Israel Gondres Torne, Jociele Almeida Azevedo, Kethlen Mendes Caetano, José Rudiney Junior, Deep Learning-Based Detection of Shield Presence in Industrial Laser-Marking Applications, in Proceedings of The 3rd International Electronic Conference on Machines and Applications, 12 May–14 May 2026, MDPI: Basel, Switzerland
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Deep Learning-Based Detection of Shield Presence in Industrial Laser-Marking Applications

Jociele Almeida Azevedo 2
Kethlen Mendes Caetano 1
image
1. Universidade do Estado do Amazonas, Manaus, Brazil, Brazil
2. Universidade Paulista, Manaus, Brazil, Brazil
3. PPGEEL- Postgraduate Program in Electrical Engineering, School of Technology, State University of Amazonas (UEA), Manaus 69050-020, Brazil, Brazil
Abstract

This paper presents the development and implementation of a computer vision-
based system aimed at improving the reliability and operational safety of an industrial laser-marking process applied to electronic boards. The investigated process involves a board
containing six integrated circuits, over which metallic shields must be correctly positioned
prior to the laser-marking stage to protect sensitive internal components. If a shield is absent
during this operation, the laser may directly affect the chip surface, leading to irreversible
damage, functional degradation, and significant production losses.
To mitigate this risk, an automated visual inspection system was designed to verify,
in a non-invasive manner, the presence or absence of the shield on each individual chip
before authorizing the laser-marking process. The proposed solution was implemented using
the Python programming language and was based on deep learning techniques for object
detection. Specifically, a YOLO-family model in its nano configuration was employed and
trained to classify two distinct conditions: shielded chips and unshielded chips. The use of
a compact model enabled the efficient execution of standard computing hardware,
achieving an average inference time of approximately 300 ms. Although industrial processes
do not impose strict real-time or cycle-time constraints, this inference latency is considered
adequate for reliable integration into the production workflow.
Experimental results demonstrate that the proposed system operates consistently in
an industrial environment, effectively preventing improper laser-marking operations. The
solution acts as an additional layer for fault prevention, contributing to enhanced process
robustness, improved product quality, and increased overall reliability of the manufacturing
system.

Keywords
Computer Vision
Deep Learning
YOLO
Industrial Inspection
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