EventsThe 1st International Electronic Conference on Crystals
Published
This submission belongs to the session E. Nano- and Two-Dimensional Crystals of the event The 1st International Electronic Conference on Crystals
Published date
21 May, 2018
Citation
Zhongli Zhang, Jinming Zhang, yushan Ni, Can Wang, Kun Jiang, Xuedi Ren, Multiscale Simulation of Surface Defect Influence In Nanoindentation by Quasi-continuum method, in Proceedings of The 1st International Electronic Conference on Crystals, 21 May–31 May 2018, MDPI: Basel, Switzerland, doi: 10.3390/IECC_2018-05246
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Multiscale Simulation of Surface Defect Influence In Nanoindentation by Quasi-continuum method

Jinming Zhang 2
Can Wang 2
Kun Jiang 2
Xuedi Ren 2
1. Fudan University
2. Shanghai Institute of Measurement and Testing Technology
Abstract

Microscopic properties of nanocrystal Aluminum thin film have been simulated using the quasicontinuum method in order to study the surface defect influence in nanoindentation. Various distances between the surface defect and indenter have been taken into account. The results show that as the distance between the pit and indenter increases, the nanohardness increases in a wave pattern associated with a cycle of three atoms, which is closely related to the crystal structure of periodic atoms arrangement on {111} atomic close-packed planes of face-centered cubic metal; when the adjacent distance between the pit and indenter is more than 16 atomic spacing, there is almost no effect on nanohardness. In addition, the theoretical formula for the necessary load for elastic-to-plastic transition of Al film has been modified with the initial surface defect size, which may contribute to the investigation of material property with surface defects.

Keywords
Nanoindentation
Quasicontinuum method
Surface defect
Multiscale simulation
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