Event submissions
X-ray powder diffraction is a powerful technique to probe crystalline materials, their purity and their structural characteristics. When coupled with synchrotron sources, it is also able to detect the subtlest details in situ, operando or in time-resolved studies.
The high flux of these sources enables also very high-throughput data collections, where over 10.000 samples can be analysed in a single day. This requires a combination of quick sample preparation, delivery, data collection and, potentially, processing. Techniques and methodologies will be presented, alongside relevant issues and opportunities such high-throughput analytics involves.