This submission belongs to the session I. Poster of the event The 2nd International Online Conference on Nanomaterials
Published date
12 Nov, 2020
Citation
Grazia Giuseppina Politano, Marco Castriota, Maria Penelope De Santo, Mario Michele Pipita, Giovanni Desiderio, Carlo Vena, Carlo Versace, <em>Variable angle spectroscopic ellipsometry characterization of spin-coated MoS<sub>2 </sub>films </em>, in Proceedings of The 2nd International Online Conference on Nanomaterials, 15 November–30 November 2020, MDPI: Basel, Switzerland, doi: 10.3390/IOCN2020-07978
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Variable angle spectroscopic ellipsometry characterization of spin-coated MoS2 films
Grazia Giuseppina Politano 1
Marco Castriota 1
Maria Penelope De Santo 1
Mario Michele Pipita 2
Giovanni Desiderio 1
Carlo Vena 1
Carlo Versace 1
1. Dipartimento di Fisica, Università della Calabria 87036 Rende CS, Italy
2. Notredame s.r.l., c/o Dipartimento di Fisica, Università della Calabria, Italy