Symmetry Webinar | Electron Diffraction and Structural Imaging at Nanoscale
the chair
16th Symmetry Webinar
Electron Diffraction and Structural Imaging at Nanoscale
I would like to thank MDPI and Symmetry for their support in organizing the webinar as a part of the Special Issue on Electron Diffraction and Structural Imaging. The Special Issue has had two volumes; the first closed in January 2022, and the second is still open for manuscript submission (deadline January 31, 2024).
Both Special Issues published in Symmetry show the latest research and developments in electron diffraction and structure imaging, aligned as the electron microscopy techniques evolve rapidly. These emerging advances in electron microscopy have the potential to open up new possibilities in materials science. As of now, we have collected a total of 17 high-quality papers. I would also like to thank all the Guest Editors: Dr. Arturo Ponce-Pedraza from the University of Texas at San Antonio, USA, Dr. Enrico Mugnaioli from the University of Pisa, Italy, and Dr. Stavros Nicolopoulos from NanoMEGAS SPRL, Belgium, for being part of the Special Issue and sharing their inputs, experience, and support through published articles. Also, I would like to thank our three invited speakers, experts in the topics covered in the Special Issue of Symmetry, who kindly agreed to present their research works in this webinar.
Date: 14 November 2023
Time: 4:00 pm CET | 10:00 am EST | 11:00 pm CST Asia
Webinar ID: 896 4853 9964
Webinar Secretariat: journal.webinar@mdpi.com
Meet the Event Chair
Meet Our Speakers
Dr. Muriel Veron
Univ. Grenoble Alpes, CNRS, Grenoble INP, SIMAP, Grenoble, France;
Dr. Muriel Veron received her Engineering degree and her Ph.D. in Material Science and Engineering from Grenoble-INP, France. After completing her PhD in 1995, she joined McMaster University, Canada's Materials Science and Engineering Department as a Postdoctoral Research Associate. In 1996, she returned to France to take an Assistant Professor position at Grenoble-INP and SIMaP Laboratory (Material Science and Process Laboratory). She was made a professor in 2008. Since 2009, she has held the post of Deputy Director of the engineering school Phelma, with 1200 students and important international collaborations. In July 2011, she was awarded the APERAM Rene Castro Prize for her contributions to steel phase transformations and alloy design. In the Metal Physics department at SIMaP, her research focuses on the coupling between microstructure and mechanical properties. She works closely with industrial collaborators on fundamental and applied topics. Muriel Veron has contributed significantly to the development of TEM automated orientation mapping in association with the pioneering work of Dr. Edgar Rauch (CNRS); this has resulted in orientation and phase maps at the nanometer scale and provided the scientific and industrial communities with a new and powerful tool to investigate materials. she published more than 120 articles including conference proceedings, organized more than 25 workshops dedicated to crystallography and phase/orientation mapping tool (ASTAR), and supervised 20 PhD students.
Dr. Jean-Luc Rouviére
CEA/INAC/SP2M/LEMMA, 19 rue des Martyrs, Grenoble, France;
Jean-Luc ROUVIERE is a senior scientist at the French Alternative Energy and Atomic Energy Commission (CEA), where he uses and develops Transmission Electron Microscopy (TEM). After graduating from the Ecole Polytechnique in Paris in 1985, he joined CEA in Grenoble to complete his Ph.D. on determining the atomic structure of Si grain boundaries using High-Resolution TEM (HR-TEM). His PhD work earned him the Pierre Favard Prize. In 1990-1991, he was a visiting scientist at AT&T Bell Labs in Holmdell, US, where he applied QuantiTEM to diffusion studies. In 2005, he and the research laboratory he belongs to joined the Minatec characterization platform, which combines various advanced characterization tools, such as FIB, TEM, SIMS, and Atom Probe. His main research achievements include (i) interface and (ii) strain map studies in semiconductors using various TEM techniques based on high-resolution images (TEM and STEM) or Electron Diffraction Maps (eDM), also known as 4D-STEM. He also promotes the use of Scanning Precession Electron Diffraction (4D-SPED). Currently, he is focusing on using eDM to obtain information about the electric, magnetic, and atomic structure of nano-objects or devices.
Dr. Holger Klein
Institut Néel, Université Grenoble-Alpes and CNRS, Grenoble, France;
Holger Klein is an Associate Professor at the Université Grenoble Alpes working at the Néel Institute, Grenoble, France. He has been involved in electron crystallography by precession electron diffraction since 2006. He is a former Chair (2011 – 2015) and Co-chair (2015 – 2018) of the Special Interest Group on electron crystallography of the European Crystallographic Association and has participated as a lecturer in several schools on electron crystallography. He worked mainly on oxide structures before his interest shifted towards beam-sensitive materials like natural minerals and metal-organic-frameworks in recent years.
Sponsors and Partners
Organizer
Summary from the Chair
We would like to thank MDPI, the speakers and all the participants for joining the webinar on Electron Diffraction and Structural Imaging at Nanoscale as part of the special issue "Electron Diffraction and Structural Imaging". We look forward to seeing your work in the special issue.
In this section, you will find the recordings of this webinar to watch, re-watch and share with your colleagues!
"Electron Diffraction and Structural Imaging II"
Edited by Dr. Partha Pratim Das, Dr. Arturo Ponce-Pedraza, Dr. Enrico Mugnaioli and Dr. Stavros Nicolopoulos