|
Speaker/Presentation |
Time in CEST |
Time in CST (Asia) |
Time in UTC |
|
Dr. Peter Kinnell (Chair) Introduction to the webinar |
3:30 – 3:40 pm |
9:30 – 9:40 pm |
1:30 – 1:40 pm |
|
Mr. Marcio Piecha (Speaker 1) Improving the calibration of Terrestrial Laser Scanners (TLSs) |
3:40 – 3:55 pm |
9:40 – 9:55 pm |
1:40 – 1:55 pm |
|
Mr. John Leffingwell and Mr. Joe Conrad (Speaker 2 and 3) The Symbiotic Relationship Between Relms & Splats |
3:55 – 4:10 pm |
9:55 – 10:10 pm |
1:55 – 2:10 pm |
|
Dr. Daniel Heisselmann (Speaker 4) Digital Metrological Twins - Evaluating Task-Specific Measurement Uncertainty in Advanced Manufacturing |
4:10 – 4:25 pm |
10:10 – 10:25 pm |
2:10 – 2:25 pm |
|
Mr. Oier Saez de Egilaz (Speaker 5) Uncertainty-Aware Close-Range Photogrammetry Design 2D Measurement Accuracy of Circular Markers by Characterization and Precision Modelling for Subpixel Methods. |
4:25 – 4:40 pm |
10:25 – 10:40 pm |
2:25 – 2:40 pm |
|
Q&A |
4:40 – 4:55 pm |
10:40 – 10: 55 pm |
2:40 – 2:55 pm |
|
Dr. Peter Kinnell (Chair) Closing of Webinar
|
4:55 – 5:00 pm |
10:55 – 11:00 pm |
2:55 – 3:00 pm |