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Mr. Marcio Piecha
SENAI ISI SIM (Research and Technology organization), Brazil
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Mr. John Leffingwell
Quidient (Technology Development Company), USA
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Mr. Joe Conrad
Quidient (Technology Development Company), USA
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Dr. Daniel Heisselmann
PTB (National Metrology Institute), Germany
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Mr. Oier Saez de Egilaz
IDEKO (Research Centre in Advanced Manufacture), Spain (Basque Country)
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Metrology-2
cheryl.lim@mdpi.com
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