Please login first

Metrology Webinar | 3DMC 2026 – Previewing the Latest Advances in 3D Metrology

8 May 2026, 15:30 (CEST)

Registration Deadline
8 May 2026

3D Metrology, 3D Metrology Conference, Cultural Heritage Recording, EU Metrology Project, Generalized Scene Reconstruction, Terrestrial Laser Scanners, Large-Volume Scanning
Bookmark
Bookmark event Remove event from bookmarks
Add this event to bookmarks
Event Registration Contact Us

Welcome from the Chair

Metrology Webinar
3DMC 2026 – Previewing the Latest Advances in 3D Metrology

The 3D Metrology Conference (3DMC - www.3dmc.events) brings together researchers, engineers and scientists who are interested in 3D metrology. During this webinar we will hear from speakers drawn from the global 3DMC community. They represent organizations which have all previously presented at the 3DMC and will be present again at this year’s event in London. They will be telling us about their current 3D metrology projects and the progress they are making with these.

Marcio Piecha from the SENAI Institute in Brazil will tell us about the latest improvements in the calibration of Terrestrial Laser Scanners. John Leffingwell and Joe Conrad from the American technology company Quidient will discuss alternative technologies of reality modelling, Relms, and Gaussian splats, for the realistic rendering of 3D models by smart phones. Daniel Heisselmann joins us from the PTB, Germany’s national metrology institute. Daniel has a great deal of experience with European multi-partner research projects and will be highlighting one of the latest, the ADAM project. Finally, we will hear from Oier Saez de Egilaz, who works for IDEKO, an advanced manufacturing research centre in Spain’s Basque Country. He will tell us more about the accuracy of marker measurement in close-range photogrammetry.

Please join us for this interesting programme of talks with opportunities to put questions to the presenters.

Date: 8 May 2026
Time: 1:30 pm UTC | 3:30 pm CEST | 09:30 am EDT | 9:30 pm CST Asia
Webinar ID: 898 7216 8355
Webinar Secretariat: journal.webinar@mdpi.com

Event Chairs

Intelligent Automation Centre, Loughborough University, UK

Introduction
Bio
Peter Kinnell is a Professor of Metrology at Loughborough University and is director of the Intelligent Automation Centre, a multidisciplinary research centre for advanced robotics and digital automation. His own research is focused on the use of metrology and sensor technology in manufacturing and automation applications.

Keynote Speakers

SENAI ISI SIM (Research and Technology organization), Brazil

Introduction
Talk
Improving the Calibration of Terrestrial Laser Scanners (TLSs)
Bio
Marcio is a researcher and metrology specialist at SENAI, with more than ten years of experience in the development of measurement methods and processes in metrology. He holds a Master’s degree in Mechanical Engineering from the Federal University of Rio Grande do Sul (UFRGS), where his research focused on the calibration of laser scanners.

Quidient (Technology Development Company), USA

Introduction
Talk
The Relms vs. Splats Wars in GSR
Bio
John Leffingwell is Quidient’s co-founder and Chief Technology Officer (CTO). He has deep expertise in the real-world physics and algorithms of 3D shape-from-polarization, as well as experience developing an early-stage technology business with worldwide reach. He has spent the past 15 years innovating in computational geometry, including 3 years at Photon-X, Inc., bringing shape-from-polarization technology into more general operating environments. Early in his career, John co-founded InterGrafx, Inc., which grew to 70 people in California and Asia, to bring interactive true-3D capabilities to commodity mobile phones from the 1990s era. John earned his bachelor’s degree in CS/EE with a minor in physics from MIT.

Quidient (Technology Development Company), USA

Introduction
Talk
The Relms vs. Splats Wars in GSR
Bio
Joe double majored at Eckerd College in Marine Science (focus on Biology) and History (focus on East Asia). To complete his education, Joe studied Ancient History (Greek and Roman) while minoring in Digital Preservation Technology at the University of South Florida. Joe was introduced to 3D technologies at USF, including LiDAR, photogrammetry, and 3D printing from a cultural heritage/preservation perspective. Joe is an expert in capturing and processing various 3D deliverables using tools and techniques including photogrammetry, LiDAR, structured light, and enterprise-grade UAS.

PTB (National Metrology Institute), Germany

Introduction
Talk
The EU ADAM Project
Bio
Dr. Daniel Heißelmann is the head of the working group "Coordinate Measuring Systems" at the Department of Coordinate Metrology at Physikalisch-Technische Bundesanstalt (PTB), the National Metrology Institute of Germany. He studied physics in Osnabrück and Braunschweig and in 2015 received his doctoral degree at the Braunschweig University of Technology (TU Braunschweig) on the topic "Collisional properties of Saturnian ring particles". His research activities are focused on methods to assess measurement uncertainty in coordinate metrology, ensuring traceability, advancing digitalization in through Digital–Metrological Twins—such as the Virtual Coordinate Measuring Machine VCMM—and the development of digital calibration certificates (DCCs).

IDEKO (Research Centre in Advanced Manufacture), Spain (Basque Country)

Introduction
Talk
Uncertainty-Aware Close-Range Photogrammetry Design 2D Measurement Accuracy of Circular Markers by Characterization and Precision Modelling for Subpixel Methods.
Bio
Oier is an engineer in the Design and Precision Engineering research group at the IDEKO technology centre, which he joined in 2023. He obtained his degree in Automotive Engineering and his Master's degree in Control Engineering, Automation and Robotics at the University of the Basque Country (UPV/EHU) in 2021 and 2023, respectively. He is currently undertaking a PhD centred on the design and modelling of high‑precision close‑range photogrammetric systems.

Registration

This is a FREE webinar. After registering, you will receive a confirmation email containing information on how to join the webinar. Registrations with academic institutional email addresses will be prioritized.

Certificates of attendance will be delivered to those who attend the live webinar.

Can’t attend? Register anyway and we’ll let you know when the recording is available to watch.

Program

Speaker/Presentation

Time in CEST

Time in CST (Asia)

Time in UTC

Dr. Peter Kinnell (Chair)

Introduction to the webinar

3:30 – 3:40 pm

9:30 – 9:40 pm

1:30 – 1:40 pm

Mr. Marcio Piecha (Speaker 1)

Improving the calibration of Terrestrial Laser Scanners (TLSs)

3:40 – 3:55 pm

9:40 – 9:55 pm

1:40 – 1:55 pm

Mr. John Leffingwell and Mr. Joe Conrad (Speaker 2 and 3)

The Relms vs. Splats Wars in Generalized Scene Reconstruction (GSR)

3:55 – 4:10 pm

9:55 – 10:10 pm

1:55 – 2:10 pm

Dr. Daniel Heisselmann (Speaker 4)

Digital Metrological Twins - Evaluating Task-Specific Measurement Uncertainty in Advanced Manufacturing

4:10 – 4:25 pm

10:10 – 10:25 pm

2:10 – 2:25 pm

Mr. Oier Saez de Egilaz (Speaker 5)

Uncertainty-Aware Close-Range Photogrammetry Design

2D Measurement Accuracy of Circular Markers by Characterization and Precision Modelling for Subpixel Methods.

4:25 – 4:40 pm

10:25 – 10:40 pm

2:25 – 2:40 pm

Q&A

4:40 – 4:55 pm

10:40 – 10: 55 pm

2:40 – 2:55 pm

Dr. Peter Kinnell (Chair)

Closing of Webinar

4:55 – 5:00 pm

10:55 – 11:00 pm

2:55 – 3:00 pm

Sponsors and Partners

Organizers

Top