Platinum diselenide (PtSe₂), which belongs to the transition metals dichalcogenide (TMDCs) class of 2D materials, is characterized with a transition from semimetal to semiconductor with a thickness variation from bulk to monolayer and found versatile applications especially in sensors and mid-infrared detectors. In this study we report the large-scale synthesis of PtSe₂ layers by thermally assisted selenization of pre-deposited platinum films in horizontal quartz-tube Chemical Vapour Deposition (CVD) reactor. Raman spectroscopy, X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) are used for characterization of the obtained 2D PtSe₂. It is observed that the Raman spectra of PtSe₂ show strong dependence on the thickness (Pt deposition time). XPS analysis was applied to examine the chemical compositions in order to assess the quality of the synthesized PtSe₂ films. All the studied properties reveal great potential to obtain continuous layers with controlled thickness and composition and further potential for integration in functional heterostructures for future nanoelectronic and optoelectronic devices.